Fixtureless non-contact fatigue testing for nano-scale thin films using electromagnetism method
Submitted by Caspar_admin on Fri, 07/12/2013 - 21:40Provisional Patent, Zheng, J., and Sitaraman, S.K., “Fixtureless non-contact fatigue testing for nano-scale thin films using electromagnetism method,” July 2005, Based on Invention Disclosure GTRC ID# 3561.
type:
Provisional Patent
Year:
2 005