Intel Best Student Paper at 62nd ECTC
Submitted by Caspar_admin on Fri, 07/12/2013 - 22:31Sathyanarayanan Raghavan
Interlayer Dielectric Cracking in Back End of Line (BEOL) Stack by Sathyanarayanan Raghavan – Georgia Institute of Technology; Ilko Schmadlak – Freescale Semiconductor; and Suresh K. Sitaraman
type:
Student Award
Year:
2 012