2000 Best Paper of the Year, IEEE Transactions on Components and Packaging Technologies
Submitted by Caspar_admin on Fri, 07/12/2013 - 23:15"Development of Virtual Reliability Methodology for Area-Array Devices used in Implantable and Automotive Applications," S. Sitaraman, R. Raghunathan, and C. E. Hanna, 2000
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Award
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2 000