Characterization of Mechanical Properties of Thin Films by Nanoindentation Technique and Finite Element Simulation
Submitted by Caspar_admin on Fri, 01/03/2014 - 20:39Citation:
Shan, Z and Sitaraman, S.K (2002). Characterization of Mechanical Properties of Thin Films by Nanoindentation Technique and Finite Element Simulation. Proceedings of the ASME International Mechanical Engineering Congress and Exposition, November 17-22, 2002, New Orleans, LA, IMECE2002/EPP-39668.